• DocumentCode
    3405664
  • Title

    Automatic point-based facial trait judgments evaluation

  • Author

    Rojas Q, Mario ; Masip, David ; Todorov, Alexander ; Vitrià, Jordi

  • Author_Institution
    Comput. Vision Center, Spain
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    2715
  • Lastpage
    2720
  • Abstract
    Humans constantly evaluate the personalities of other people using their faces. Facial trait judgments have been studied in the psychological field, and have been determined to influence important social outcomes of our lives, such as elections outcomes and social relationships. Recent work on textual descriptions of faces has shown that trait judgments are highly correlated. Further, behavioral studies suggest that two orthogonal dimensions, valence and dominance, can describe the basis of the human judgments from faces. In this paper, we used a corpus of behavioral data of judgments on different trait dimensions to automatically learn a trait predictor from facial pixel images. We study whether trait evaluations performed by humans can be learned using machine learning classifiers, and used later in automatic evaluations of new facial images. The experiments performed using local point-based descriptors show promising results in the evaluation of the main traits.
  • Keywords
    face recognition; image classification; learning (artificial intelligence); performance evaluation; psychology; automatic evaluations; automatic point-based facial trait judgments evaluation; behavioral data; dominance; facial images; facial pixel images; local point-based descriptors show; machine learning classifiers; orthogonal dimensions; performance evaluation; psychological field; trait dimensions; trait predictor; valence; Computer vision; Databases; Face; Humans; Machine learning; Performance evaluation; Pixel; Principal component analysis; Protocols; Psychology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-6984-0
  • Type

    conf

  • DOI
    10.1109/CVPR.2010.5539993
  • Filename
    5539993