DocumentCode :
3405676
Title :
Study on anechoic chamber for EMI measurement. 2. Measurement and evaluation of chamber characteristics
Author :
Maeda, Atsuya ; Osabe, Kunihiro
Author_Institution :
Matsushita Commun. Ind. Co., Ltd., Yokohama, Japan
fYear :
1990
fDate :
21-23 Aug 1990
Firstpage :
247
Lastpage :
251
Abstract :
For pt.1 see IEEE 1989 Int. Symp. on EMC, p.149-53 (1989). It is pointed out that site attenuation of a semi-anechoic chamber must be measured in the same manner as for an open-field test site. Absorbers generate strong reflections at some frequencies, necessitating swept frequency measurements. It is noted, however, that reliable reference values of site attenuation for wideband biconical or log-periodic antennas cannot be obtained either by comparison with open-field sites or by theoretical calculation. The authors propose the use of shortened dipole antennas from which calculated theoretical values can be obtained. Results of actual measurements in a full-anechoic chamber using a shortened dipole antenna are shown. Chamber defects caused by the influence of reflections from the chamber wall appear much more clearly when measurements are made with the antenna height fixed than when antenna height is varied to obtain minimum site attenuation. Thus, fixed height is more suitable for strict chamber evaluation
Keywords :
anechoic chambers; attenuation measurement; dipole antennas; electromagnetic interference; swept-frequency reflectometry; EMI measurement; absorber reflections; antenna height; chamber defects; electromagnetic interference; log-periodic antennas; open-field test site; semi-anechoic chamber; shortened dipole antennas; site attenuation; swept frequency measurements; wideband biconical antennas; Anechoic chambers; Antenna measurements; Attenuation measurement; Dipole antennas; Electromagnetic compatibility; Electromagnetic interference; Frequency; Reflection; Reflector antennas; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-7264-6
Type :
conf
DOI :
10.1109/ISEMC.1990.252768
Filename :
252768
Link To Document :
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