• DocumentCode
    3405696
  • Title

    ESD simulator tip voltage at the instant of test

  • Author

    Richman, P. ; Weil, G. ; Boxleitner, W.

  • Author_Institution
    KeyTek Instrum. Corp., Wilmington, MA, USA
  • fYear
    1990
  • fDate
    21-23 Aug 1990
  • Firstpage
    252
  • Lastpage
    257
  • Abstract
    It is pointed out that, for air-discharge (as compared with contact-mode) ESD (electrostatic discharge) testing, the actual voltage at the tip of an ESD simulator at the instant of test can depend on simulator design. Different simulator designs give different test outcomes, particularly for plastic-enclosed products. In one ESD simulator design, the constant-voltage configuration, simulator voltage remains constant during victim approach. In another design, the isolated-capacitor configuration, the tip voltage may decrease as it approaches the equipment victim. A third design, called the quasi-isolated capacitor design, is proposed. It retains the advantages of the constant-voltage configuration and high accuracy for the basic simulator voltage. Its output voltage is also invariant, for practical purposed, with capacitance change due to victim approach. However, it does retain the advantage of the isolated-capacitor design when it is desired
  • Keywords
    electrostatic devices; electrostatic discharge; test equipment; voltage measurement; ESD simulator tip voltage; ESD testing; air-discharge; capacitance change; constant-voltage configuration; electrostatic discharge; isolated-capacitor configuration; output voltage; plastic-enclosed products; quasi-isolated capacitor design; victim approach; Apertures; Capacitance; Capacitors; Corona; Electronic equipment testing; Electrostatic discharge; Humans; Instruments; Plastics; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-7264-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.1990.252769
  • Filename
    252769