DocumentCode :
3405707
Title :
Facial point detection using boosted regression and graph models
Author :
Valstar, Michel ; Martinez, Brais ; Binefa, Xavier ; Pantic, Maja
Author_Institution :
Dept. of Comput., Imperial Coll. London, London, UK
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
2729
Lastpage :
2736
Abstract :
Finding fiducial facial points in any frame of a video showing rich naturalistic facial behaviour is an unsolved problem. Yet this is a crucial step for geometric-feature-based facial expression analysis, and methods that use appearance-based features extracted at fiducial facial point locations. In this paper we present a method based on a combination of Support Vector Regression and Markov Random Fields to drastically reduce the time needed to search for a point´s location and increase the accuracy and robustness of the algorithm. Using Markov Random Fields allows us to constrain the search space by exploiting the constellations that facial points can form. The regressors on the other hand learn a mapping between the appearance of the area surrounding a point and the positions of these points, which makes detection of the points very fast and can make the algorithm robust to variations of appearance due to facial expression and moderate changes in head pose. The proposed point detection algorithm was tested on 1855 images, the results of which showed we outperform current state of the art point detectors.
Keywords :
Markov processes; computational geometry; face recognition; feature extraction; graph theory; regression analysis; support vector machines; Markov random fields; appearance-based features extraction; boosted regression; facial point detection; fiducial facial points; geometric-feature-based facial expression analysis; graph models; support vector regression; Active shape model; Detectors; Educational institutions; Face detection; Facial features; Feature extraction; Gabor filters; Markov random fields; Mouth; Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location :
San Francisco, CA
ISSN :
1063-6919
Print_ISBN :
978-1-4244-6984-0
Type :
conf
DOI :
10.1109/CVPR.2010.5539996
Filename :
5539996
Link To Document :
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