Title :
A study of the repeatability of electrostatic discharge simulators
Author :
Maas, John ; Pratt, Daniel
Author_Institution :
IBM Application Bus. Syst., Rochester, MN, USA
Abstract :
The repeatability of electrostatic discharge (ESD) testing using commercially available, lumped capacitance ESD simulators is examined. The pulse generated by the simulator and the indirect application of discharges using a flat, metallic coupling plane are studied. Some of the parameters that may affect repeatability are the angle between the simulator and the test sample or coupling plane, location of the discharge on the coupling plane, and the location of the simulator´s ground return cable. It is concluded that using a lumped element ESD simulator and a flat metal plate is a viable method of testing an electronic product to determine its immunity to indirect ESD
Keywords :
electronic equipment testing; electrostatic discharge; test equipment; ESD testing; electronic product testing; electrostatic discharge simulators; flat metal plate; lumped capacitance ESD simulators; repeatability; Biological system modeling; Blades; Capacitance; Capacitors; Circuit simulation; Circuit testing; Electrostatic discharge; Fault location; Humans; Immune system;
Conference_Titel :
Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-7264-6
DOI :
10.1109/ISEMC.1990.252771
