DocumentCode
3405826
Title
Bundled depth-map merging for multi-view stereo
Author
Li, Jianguo ; Li, Eric ; Chen, Yurong ; Xu, Lin ; Zhang, Yimin
Author_Institution
Intel Labs. China, Beijing, China
fYear
2010
fDate
13-18 June 2010
Firstpage
2769
Lastpage
2776
Abstract
Depth-map merging is one typical technique category for multi-view stereo (MVS) reconstruction. To guarantee accuracy, existing algorithms usually require either sub-pixel level stereo matching precision or continuous depth-map estimation. The merging of inaccurate depth-maps remains a challenging problem. This paper introduces a bundle optimization method for robust and accurate depth-map merging. In the method, depth-maps are generated using DAISY feature, followed by two stages of bundle optimization. The first stage optimizes the track of connected stereo matches to generate initial 3D points. The second stage optimizes the position and normals of 3D points. High quality point cloud is then meshed as geometric models. The proposed method can be easily parallelizable on multi-core processors. Middlebury evaluation shows that it is one of the most efficient methods among non-GPU algorithms, yet still keeps very high accuracy. We also demonstrate the effectiveness of the proposed algorithm on various real-world, high-resolution, self-calibrated data sets including objects with complex details, objects with large area of highlight, and objects with non-Lambertian surface.
Keywords
image matching; image reconstruction; optimisation; stereo image processing; DAISY feature; Middlebury evaluation; bundle optimization method; bundled depth-map merging; depth-map estimation; multicore processor; multiview stereo reconstruction; nonLambertian surface; self-calibrated data set; sub-pixel level stereo matching; Algorithm design and analysis; Clouds; Design methodology; Image reconstruction; Merging; Multicore processing; Optimization methods; Robustness; Solid modeling; Stereo image processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location
San Francisco, CA
ISSN
1063-6919
Print_ISBN
978-1-4244-6984-0
Type
conf
DOI
10.1109/CVPR.2010.5540004
Filename
5540004
Link To Document