Title :
A stochastic learning algorithm for pixel-level background models
Author :
Mould, N. ; Havlicek, Joseph P.
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Oklahoma, Norman, OK, USA
fDate :
Sept. 30 2012-Oct. 3 2012
Abstract :
A new stochastic learning algorithm for use in nonparametric pixel-level background models is presented in this paper. For the first time, we propose the use of kernel density estimation (KDE) techniques in the model update step to identify outliers within the pixel-level sample collections and replace them with with recently observed background image features. A neighborhood diffusion process that improves on recently reported scene model learning techniques is presented, wherein information sharing between similarly structured adjacent background models is encouraged to promote spatial consistency within localized image regions. We demonstrate the superiority of the proposed algorithm by comparison with the state-of-the-art ViBe system using the well known percentage correct classification (PCC) statistic and a new figure of merit, probability correct classification (PrCC), presented here for the first time.
Keywords :
estimation theory; image classification; image resolution; image segmentation; learning (artificial intelligence); stochastic processes; video signal processing; KDE; PCC; PrCC; ViBe system; adjacent background models; background image features; kernel density estimation techniques; localized image regions; neighborhood diffusion process; nonparametric pixel-level background models; outlier identification; percentage correct classification statistic; pixel-level sample collections; probability correct classification; scene model learning techniques; spatial consistency; stochastic learning algorithm; video segmentation; Computational modeling; Gray-scale; Image segmentation; Kernel; Positron emission tomography; Real-time systems; Surveillance; background modeling; scene modeling; video segmentation;
Conference_Titel :
Image Processing (ICIP), 2012 19th IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-2534-9
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2012.6467089