Title :
Radiated emissions of very large scale integrated circuits
Author :
Muccioli, James ; Ashley, Scott
Author_Institution :
Chrysler Motors Corp., Highland Park, MI, USA
Abstract :
EMC (electromagnetic compatibility) testing was performed on a microprocessor to examine its radiated emissions. Special software was also written to exercise different functions of the microprocessor to determine how software affects emissions. Results indicate that a microprocessor does radiate and software can have a large influence on radiated emissions
Keywords :
VLSI; electromagnetic compatibility; integrated circuit testing; microprocessor chips; microprogramming; EMC testing; electromagnetic compatibility; microprocessor; radiated emissions; software; very large scale integrated circuits; Application specific integrated circuits; Circuit testing; Containers; Integrated circuit measurements; Microprocessors; Performance evaluation; Pins; Printed circuits; Silicon; Very large scale integration;
Conference_Titel :
Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-7264-6
DOI :
10.1109/ISEMC.1990.252776
