• DocumentCode
    3405862
  • Title

    A fast method for computing radiation from printed circuit boards

  • Author

    Daijavad, S. ; Janak, J. ; Heeb, H. ; Ruehli, A. ; McBride, D.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    1990
  • fDate
    21-23 Aug 1990
  • Firstpage
    300
  • Lastpage
    304
  • Abstract
    An alternative approach for computing radiation from a multilayer circuit board is presented. Compared to a full-wave electromagnetic approach, this method is much faster and requires less storage space for data. Computational efficiency is the key attribute of the approach. It allows solutions, previously unobtainable, to complex and realistic structures, such as those arising from typical product designs. The radiation is calculated using a transmission line model to find the amplitude and spatial distribution of currents in printed circuit traces. The far field is computed using the Green´s function of a current element just above, or inside, a thin dielectric sheet. Two examples are considered: (1) a comparison of results in the frequency domain obtained by using the method described here with those of a full-wave electromagnetic approach based on the method of moments; and (2) a comparison of simulation results with real semianechoic chamber measurements
  • Keywords
    Green´s function methods; circuit analysis computing; electromagnetic compatibility; frequency-domain analysis; printed circuit design; Green´s function; computational efficiency; far field; fast computation method; frequency domain analysis; multilayer circuit board; printed circuit boards; radiation; transmission line model; Computational efficiency; Dielectrics; Distributed parameter circuits; Electromagnetic radiation; Frequency domain analysis; Green´s function methods; Moment methods; Nonhomogeneous media; Printed circuits; Product design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-7264-6
  • Type

    conf

  • DOI
    10.1109/ISEMC.1990.252777
  • Filename
    252777