Title :
Dependence of backscattering enhancement from randomly very rough surfaces
Author :
Hsieh, Chin-Yuan
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Kaohsiung Inst. of Marine Tech., Taiwan
Abstract :
The recent observations of surface backscattering enhancement phenomenon from randomly rough Gaussian surfaces with large slopes were reported experimentally and stimulated the critical discussions. In this paper the IEM model with multiple scattering and suitable shadowing function (IEMMS) is developed to be able to predict this phenomenon of backscattering enhancement. The backscattering enhancement may take place when the surface rms slope is of the order of unity and large rms height. Also, the backscattering enhancement can also be predicted from the multiple surface scattering from a very roughly random surface. To the best of the author´s acknowledge, this is the first attempt to set up a fully integration equation model for fully theoretical polarized scattering. The derivation of basic surface. Scattering model is provided and a computer simulation is also provided to compare the experimental measurement
Keywords :
backscatter; geophysical techniques; radar cross-sections; radar theory; random media; remote sensing by radar; rough surfaces; terrain mapping; IEM model; backscatter; backscattering enhancement; geophysical measurement technique; land surface; large slope; multiple scattering; radar remote sensing; radar scattering; random surface; randomly very rough surface; rough Gaussian surface; shadowing function; terrain mapping; Backscatter; Dielectric measurements; Frequency; Integral equations; Magnetic field measurement; Optical scattering; Predictive models; Rough surfaces; Surface roughness; Surface waves;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1999. IGARSS '99 Proceedings. IEEE 1999 International
Conference_Location :
Hamburg
Print_ISBN :
0-7803-5207-6
DOI :
10.1109/IGARSS.1999.775075