• DocumentCode
    3406045
  • Title

    Multilinear feature extraction and classification of multi-focal images, with applications in nematode taxonomy

  • Author

    Liu, Min ; Roy-Chowdhury, Amit K.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of California, Riverside, CA, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    2823
  • Lastpage
    2830
  • Abstract
    In this paper, we present a 3D X-Ray Transform based multilinear feature extraction and classification method for Digital Multi-focal Images (DMI). In such images, morphological information for a transparent specimen can be captured in the form of a stack of high-quality images, representing individual focal planes through the specimen´s body. We present a method that can effectively exploit the entire information in the stack using the 3D X-Ray projections at different viewing angles. These DMI stacks represent the effect of different factors - shape, texture, viewpoint, different instances within the same class and different classes of specimens. For this purpose, we embed the 3D X-Ray Transform within a multilinear framework and propose a Multilinear X-Ray Transform (MXRT) feature representation. By combining the tensor texture and shape information we can get better recognition rates than just relying on the original or key frames of DMI stacks. The experimental results on the nematode DMI data show that the 3D X-Ray Transform based multilinear analysis method can effectively give 100% recognition rate on a real-life database.
  • Keywords
    biology computing; feature extraction; image classification; image texture; 3D x-ray transform; digital multifocal images; feature representation; multifocal images classification; multilinear feature extraction; multilinear x-ray transform; nematode taxonomy; tensor texture; Databases; Documentation; Feature extraction; Image analysis; Principal component analysis; Shape; Taxonomy; Tensile stress; Testing; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-6984-0
  • Type

    conf

  • DOI
    10.1109/CVPR.2010.5540014
  • Filename
    5540014