Title : 
RF absorber qualification criteria and measurement techniques
         
        
            Author : 
Tsaliovich, Anatoly
         
        
            Author_Institution : 
AT&T Bell Lab., Holmdel, NJ, USA
         
        
        
        
        
        
            Abstract : 
Radio-frequency absorber (RFA) performance evaluation criteria are developed with regard to electromagnetic compatibility test objectives. Measurement techniques are considered which are linked to absorber evaluation criteria and can serve as a basis to develop practical test procedures. It is shown that the RFA evaluation techniques can be related to three levels of RFA evaluation: RFA bulk material, reflecting surface lined by an absorber array, and field uniformity in an absorber lined shielding room. Only the third evaluation level explicitly matches the EMC application specifics; however, it yields narrow-in-scope results which are difficult to expand to other room sizes and shapes and absorber parameters and placements. Together with the low-frequency bulk material and high-frequency time domain reflection evaluations, this method can serve as a useful complementary technique. More general evaluation can be realized using ATS (absorber-lined open-area test-site) site attenuation measurements which result in relatively simple end-user-oriented RFA qualification procedures
         
        
            Keywords : 
attenuation measurement; electromagnetic compatibility; electromagnetic wave absorption; EMC testing; RF absorber qualification criteria; absorber-lined open area test site; measurement techniques; radio-frequency absorbers; site attenuation measurements; Electromagnetic compatibility; Electromagnetic reflection; Electromagnetic refraction; Electromagnetic scattering; Electromagnetic wave absorption; Measurement techniques; Qualifications; Radio frequency; Tellurium; Testing;
         
        
        
        
            Conference_Titel : 
Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on
         
        
            Conference_Location : 
Washington, DC
         
        
            Print_ISBN : 
0-7803-7264-6
         
        
        
            DOI : 
10.1109/ISEMC.1990.252789