• DocumentCode
    3406116
  • Title

    Natural gradients for deformable registration

  • Author

    Zikic, Darko ; Kamen, Ali ; Navab, Nassir

  • Author_Institution
    Comput. Aided Med. Procedures (CAMP), Tech. Univ. Munchen, Munich, Germany
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    2847
  • Lastpage
    2854
  • Abstract
    We apply the concept of natural gradients to deformable registration. The motivation stems from the lack of physical interpretation for gradients of image-based difference measures. The main idea is to endow the space of deformations with a distance metric which reflects the variation of the difference measure between two deformations. This is in contrast to standard approaches which assume the Euclidean frame. The modification of the distance metric is realized by treating the deformations as a Riemannian manifold. In our case, the manifold is induced by the Riemannian metric tensor based on the approximation of the Fisher Information matrix, which takes into account the information about the chosen difference measure and the input images. Thus, the resulting natural gradient defined on this manifold inherently takes into account this information. The practical advantages of the proposed approach are the improvement of registration error and faster convergence for low-gradient regions. The proposed scheme is applicable to arbitrary difference measures and can be readily integrated into standard variational deformable registration methods with practically no computational overhead.
  • Keywords
    gradient methods; image registration; tensors; Euclidean frame; Fisher information matrix; Riemannian manifold; Riemannian metric tensor; deformable registration; distance metric; natural gradients; physical interpretation; Biomedical imaging; Convergence; Distortion measurement; Erbium; Euclidean distance; Impedance; Measurement standards; Stochastic processes; Tensile stress; Thyristors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-6984-0
  • Type

    conf

  • DOI
    10.1109/CVPR.2010.5540019
  • Filename
    5540019