DocumentCode :
3406238
Title :
Extended wavelength InGaAs detectors-recent progress in new materials for bandgap wavelengths λg>1.65 μm
Author :
Dries, J.C. ; Gokhale, Milind R. ; Forrest, Stephen R. ; Olsen, Gregory H.
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., NJ, USA
Volume :
2
fYear :
1999
fDate :
1999
Firstpage :
740
Abstract :
Applications for night vision, remote sensing and spectroscopy have increased interest in the 1.65 μm to 2.5 μm wavelength band. New detectors and detector materials with access to this range of wavelengths are particularly desirable due to the limited utility of HgCdTe, InAs, InSb, and lattice-mismatched InGaAs devices. HgCdTe is plagued by material growth issues and the narrow bandgaps of InAs and InSb result in detectors with large dark currents at room temperature. Furthermore, GaInAsSb devices grown on GaSb substrates have dark currents in the microamp range for detectors as small as 100 μm diameter. The most successful commercial detector in this wavelength band is lattice-mismatched InGaAs; which, when grown on buffer layers of relaxed InAsP, results in detectors with acceptable dark currents and high bandwidth. However, residual defects in the epitaxial layers, as well as the lack of integration capability with InP electronics, necessitate the exploration of novel materials and device structures
Keywords :
III-V semiconductors; avalanche photodiodes; dark conductivity; energy gap; gallium arsenide; indium compounds; infrared detectors; optical fabrication; photodetectors; quantum well devices; semiconductor quantum wells; 1.65 mum; 1.65 to 2.5 mum; 100 mum; GaSb substrates; HgCdTe; InAs; InAsP; InGaAs; InGaAs detectors; InP electronic; InSb; bandgap wavelengths; bandwidth; buffer layers; commercial detector; dark currents; detector materials; detectors; device structures; epitaxial layers; extended wavelength detectors; integration capability; lattice-mismatched devices; material growth issues; microamp range; narrow bandgaps; night vision; novel materials; relaxed InAsP; remote sensing; residual defects; room temperature; spectroscopy; Buffer layers; Dark current; Detectors; Indium gallium arsenide; Night vision; Photonic band gap; Remote sensing; Spectroscopy; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
LEOS '99. IEEE Lasers and Electro-Optics Society 1999 12th Annual Meeting
Conference_Location :
San Francisco, CA
ISSN :
1092-8081
Print_ISBN :
0-7803-5634-9
Type :
conf
DOI :
10.1109/LEOS.1999.811946
Filename :
811946
Link To Document :
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