DocumentCode :
3406338
Title :
Efficient verification of determinate speed-independent circuits
Author :
Beerel, P.A. ; Burch, J. ; Meng, T.H.-Y.
Author_Institution :
Stanford Univ., CA, USA
fYear :
1993
fDate :
7-11 Nov. 1993
Firstpage :
261
Lastpage :
267
Abstract :
We present sufficient conditions for the correctness of speed-independent circuits with respect to their state graph (SG) specification, which can be tested in linear-time with respect to the size of the SG. Our correctness conditions consist of one safety condition and one progress condition. The progress condition detects deadlock conditions that are not present in the specification. The SG specifications considered are determinate, allowing input choice (conditionals) but not output choice (arbitration). The circuits considered are a network of basic gates; arbiters and mutual-exclusion elements are not allowed. We present an efficient algorithm to test the correctness conditions, in which false positives are not possible, but false negatives are possible. We have implemented the algorithm and present a table of run-time comparisons between our verification tool and the tool AVER by D. Dill on a large benchmark of asynchronous circuits. The results demonstrate run-times of over an order of magnitude faster than AVER and no false negatives were found. Our speedup is achieved by avoiding the state explosion problem caused by explicitly examining the behavior of internal signals.
Keywords :
asynchronous circuits; AVER; asynchronous circuits; benchmark; correctness conditions; deadlock conditions; determinate speed-independent circuits verification; progress condition; safety condition; state explosion problem; state graph specification; sufficient conditions; Automata; Circuit simulation; Circuit testing; Computational modeling; Delay; Explosions; Laboratories; Runtime; Safety; System recovery;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1993. ICCAD-93. Digest of Technical Papers., 1993 IEEE/ACM International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-4490-7
Type :
conf
DOI :
10.1109/ICCAD.1993.580067
Filename :
580067
Link To Document :
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