• DocumentCode
    3406668
  • Title

    An Ontology-Based Approach for GUI Testing

  • Author

    Li, Han ; Chen, Feng ; Yang, Hongji ; Guo, He ; Chu, William Cheng-Chung ; Yang, Yuansheng

  • Author_Institution
    Sch. of Electron. & Inf. Eng., Dalian Univ. of Technol., Dalian, China
  • Volume
    1
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    632
  • Lastpage
    633
  • Abstract
    As Graphical User Interfaces (GUIs) have almost become ubiquitous for users to interacting with software system, GUI testing becomes an essential task. GUI testing, whose basic steps are test case generation and execution result validation, is a knowledge intensive process that requires both knowledge of GUI systems and testers´ experience. In this paper, an ontology-based approach is proposed to make test case generation much effective by involving testerspsila experience. The approach first establishes a GUI testing ontology by analysing source code with reverse engineering techniques. Next test case generation rules which used to generate test cases are extracted from testerspsila experience. Then the proposed approach is evaluated. Finally conclusions are drawn and further research directions are speculated.
  • Keywords
    graphical user interfaces; ontologies (artificial intelligence); program testing; program verification; reverse engineering; GUI testing; execution result validation; graphical user interface; knowledge intensive process; ontology-based approach; reverse engineering technique; software system; source code analysis; test case generation; tester experience; user interaction; Application software; Automatic testing; Computer applications; Databases; Electronic equipment testing; Graphical user interfaces; Ontologies; Reverse engineering; Software testing; System testing; GUI Testing; Ontology; Reverse Engineering; Test Case Generation Rules;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Software and Applications Conference, 2009. COMPSAC '09. 33rd Annual IEEE International
  • Conference_Location
    Seattle, WA
  • ISSN
    0730-3157
  • Print_ISBN
    978-0-7695-3726-9
  • Type

    conf

  • DOI
    10.1109/COMPSAC.2009.92
  • Filename
    5254200