Title :
A unified approach to simulating electrical and thermal substrate coupling interactions in ICs
Author :
Verghese, N.K. ; Lee, S.-S. ; Allstot, D.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
The incomplete Choleski conjugate gradient (ICCG) method and a macromodeling technique employing asymptotic waveform evaluation (AWE) have been applied to the simulation of integrated circuits in the presence of parasitic electrical and thermal substrate coupling interactions. Simulation of electrical substrate coupling effects has been found to be accurate and fast as compared to MEDICI, a device simulation program. Simulation results are also in good agreement with reported measurements on a test chip fabricated in a 2/spl mu/m BiCMOS n-well process. DC/steady-state and transient simulations of thermal substrate interactions using similar techniques on several benchmark circuits show orders of magnitude reduction in cpu time compared to traditional simulation techniques.
Keywords :
analogue integrated circuits; 2/spl mu/m BiCMOS n-well process; ICs simulation; MEDICI; asymptotic waveform evaluation; device simulation program; electrical substrate coupling interactions; incomplete Choleski conjugate gradient method; macromodeling technique; thermal substrate coupling interactions; unified approach; Benchmark testing; BiCMOS integrated circuits; Circuit simulation; Circuit testing; Coupling circuits; Integrated circuit measurements; Integrated circuit modeling; Medical simulation; Semiconductor device measurement; Steady-state;
Conference_Titel :
Computer-Aided Design, 1993. ICCAD-93. Digest of Technical Papers., 1993 IEEE/ACM International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-4490-7
DOI :
10.1109/ICCAD.1993.580091
