DocumentCode
340693
Title
LGSO scintillation crystals coupled to new large area APDs compared to LSO and BGO
Author
Pichler, B.J. ; Böning, G. ; Rafecas, M. ; Schlosshauer, M. ; Lorenz, E. ; Ziegler, S.I.
Author_Institution
Nuklearmedizinische Klinik und Poliklinik, Tech. Univ. Munchen, Germany
Volume
1
fYear
1998
fDate
1998
Firstpage
543
Abstract
Recent developments of large area avalanche photodiodes (APDs) and fast scintillators with high light yield offer unique advantages for imaging applications. To test possible scintillator-APD combinations, 3.7×3.7×12.0 mm3 LGSO, EGO and LSO crystals were coupled to large area, low capacitance, round and rectangular APDs (5 mm diameter, 3×3 mm2 and 5×5 mm2, Hamamatsu, Japan). Light output, energy resolution and time resolution were compared. The light output of EGO was about 86% worse, of LGSO about 30% worse compared to LSO (100%). The energy resolution at 511 keV was 13.8±0.5% for LSO and 15.1±0.5% for LGSO (FWHM). With EGO 16.9±0.5% (FWHM) was measured at 662 keV. The coincident time resolution of two opposing single detectors was 2.7±0.2 ns for LSO and 3.9±0.2 ns for LGSO (FWHM). The chemical treatment of crystals showed an improved energy resolution compared to mechanically polishing of more than 1%, providing reduced cost and less processing time. An energy resolution of 10.7±0.5% for LSO could be reached after chemical etching. With the new large area APDs, results similar to PMT readout could be achieved. The scintillation characteristic of LGSO makes this material a promising candidate for APD readout, although the performance was inferior to LSO
Keywords
avalanche photodiodes; gadolinium compounds; lutetium compounds; solid scintillation detectors; EGO; LGSO scintillation crystals; LSO; LuGdSiO5:Ce; chemical etching; coincident time resolution; energy resolution; fast scintillators; large area avalanche photodiodes; light output; time resolution; Avalanche photodiodes; Capacitance; Cerium; Chemical processes; Costs; Detectors; Energy resolution; Etching; Photonic crystals; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
Conference_Location
Toronto, Ont.
ISSN
1082-3654
Print_ISBN
0-7803-5021-9
Type
conf
DOI
10.1109/NSSMIC.1998.775199
Filename
775199
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