DocumentCode
340709
Title
Temperature effects on CdZnTe detector performance
Author
Murray, W. ; Krueger, K. ; Rawool-Sullivan, M.W. ; Ussery, L. ; Whitley, C.
Author_Institution
Los Alamos Nat. Lab., NM, USA
Volume
1
fYear
1998
fDate
1998
Firstpage
643
Abstract
CdZnTe detectors are potential replacements for traditional room temperature detectors such as NaI in many applications. One particularly suitable application could be their use in portable field instruments for isotopic identification. To fully exploit them for this purpose, however, their behavior in conditions likely to be encountered in the field must be fully characterized and understood. At Los Alamos National Laboratory, we are studying one of these conditions, the effect of temperature extremes, on CdZnTe detectors. In the case of a 1×1×1 cm3 detector with a coplanar anode structure, we have found temporary degraded performance at elevated temperatures near 50°C and a failure mode at temperatures below -20°C. This paper discusses the performance of two CdZnTe crystals when exposed to temperature extremes
Keywords
semiconductor counters; 253 to 323 K; CdZnTe; CdZnTe detector; coplanar anode; performance; temperature; Anodes; Cathodes; Crystals; Degradation; Gamma ray detectors; Laboratories; Packaging; Preamplifiers; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
Conference_Location
Toronto, Ont.
ISSN
1082-3654
Print_ISBN
0-7803-5021-9
Type
conf
DOI
10.1109/NSSMIC.1998.775221
Filename
775221
Link To Document