Title :
How To Do Weighted Random Testing For Bist?
Author :
Hartmann, J. ; Kemnitz, G.
Author_Institution :
Fachbereich Informatik, Universitat des Saarlandes, 66041 Saarbrucken Germany
Abstract :
In this paper, a strategy as proposed whach takes into account all aspects of wezghted random testzng for BIST. Our approach arwes from results concerning the ampact of wezght roundang and a new combination of known techniques lake coupling unweighted and weighted pattern generation, basing weight calculation on a precomputed test.
Keywords :
Automatic test pattern generation; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Fault detection; Hardware; Lakes; Probability; Test pattern generators;
Conference_Titel :
Computer-Aided Design, 1993. ICCAD-93. Digest of Technical Papers., 1993 IEEE/ACM International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-4490-7
DOI :
10.1109/ICCAD.1993.580116
