An Efficient Bist Scheme Based On Reseeding Of Multiple Polynomial Linear Feedback Shift Registers

In this paper we describe an optimized BIST scheme based on reseeding of multiple polynomial Linear Feedback Shift Registers (LFSRs). The same LFSR that is used to generate pseudo-random patterns, is loaded with seeds from which it produces vectors that cover the testcubes of difficult to test faults. The scheme is compatible with scandesign and achieves full coverage as it is based on random patterns combined with a deterministic test set.