Title :
Error comparison for different current patterns in electrical impedance imaging
Author :
Cheng, Kuo-Sheng ; Isaacson, D. ; Newell, J.C. ; Gisser, D.G.
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
Different current patterns used in electric-current computed tomography (ECCT) were compared for their sensitivity to noise. This comparison was made by examining the error produced in reconstructing one voltage pattern from measurements made using another. It was found that the adjacent-pair current pattern is more sensitive to noise than spatial trigonometric current patterns. The measured spatial trigonometric voltage patterns were not degraded when a simulated electrode contact impedance was introduced.<>
Keywords :
bioelectric phenomena; computerised tomography; electric current; electric impedance; errors; noise; ECCT; adjacent-pair current pattern; current patterns; electric-current computed tomography; electrical impedance imaging; electrode contact impedance; error; noise; sensitivity; spatial trigonometric current patterns; spatial trigonometric voltage patterns; voltage pattern;
Conference_Titel :
Engineering in Medicine and Biology Society, 1988. Proceedings of the Annual International Conference of the IEEE
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-0785-2
DOI :
10.1109/IEMBS.1988.94516
