• DocumentCode
    3407409
  • Title

    Consensus photometric stereo

  • Author

    Higo, Tomoaki ; Matsushita, Yasuyuki ; Ikeuchi, Katsushi

  • Author_Institution
    Univ. of Tokyo, Tokyo, Japan
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    1157
  • Lastpage
    1164
  • Abstract
    This paper describes a photometric stereo method that works with a wide range of surface reflectances. Unlike previous approaches that assume simple parametric models such as Lambertian reflectance, the only assumption that we make is that the reflectance has three properties; monotonicity, visibility, and isotropy with respect to the cosine of light direction and surface orientation. In fact, these properties are observed in many non-Lambertian diffuse reflectances. We also show that the monotonicity and isotropy properties hold specular lobes with respect to the cosine of the surface orientation and the bisector between the light direction and view direction. Each of these three properties independently gives a possible solution space of the surface orientation. By taking the intersection of the solution spaces, our method determines the surface orientation in a consensus manner. Our method naturally avoids the need for radiometrically calibrating cameras because the radiometric response function preserves these three properties. The effectiveness of the proposed method is demonstrated using various simulated and real-world scenes that contain a variety of diffuse and specular surfaces.
  • Keywords
    stereo image processing; Lambertian reflectance; isotropy property; light direction; monotonicity property; nonLambertian diffuse reflectances; photometric stereo method; surface orientation; surface reflectances; view direction; visibility property; Asia; Cameras; Layout; Parametric statistics; Photometry; Plastics; Radiometry; Reflectivity; Silver; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-6984-0
  • Type

    conf

  • DOI
    10.1109/CVPR.2010.5540084
  • Filename
    5540084