Title :
Cellular automata based synthesis of easily and fully testable FSMs
Author :
Chowdhury, D.R. ; Chakraborty, S. ; Vamsi, B. ; Pal Chaudhuri, P.
Author_Institution :
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
Abstract :
The paper reports an application of a special class of non-group cellular automata, referred to as D1/sup */CA, as the test machine embedded in the FSM to be synthesized. The state transition properties of D1/sup */CA are exploited in designing an easy testing scheme for the finite state machine. The scheme has been found to incur a small area overhead while providing extremely high coverages close to 100% for all single stuck-at faults in the circuit.
Keywords :
cellular automata; D1/sup */CA; FSM; easy testing scheme; finite state machine; fully testable FSMs; non-group cellular automata; single stuck-at faults; small area overhead; state transition properties; test machine; Application software; Automata; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Computer science; Costs; Design for testability; Sequential analysis;
Conference_Titel :
Computer-Aided Design, 1993. ICCAD-93. Digest of Technical Papers., 1993 IEEE/ACM International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-4490-7
DOI :
10.1109/ICCAD.1993.580155
