Title :
Capacitors impedance measurement using ellipse fiitting algorithm with sub-nyquist samplig
Author :
Tlemcani, Mouhaydine ; Albino, Alvaro ; Silva, H.G. ; Bezzeghoud, Mourad
Author_Institution :
Evora Geophys. Centre, Univ. de Evora, Evora, Portugal
Abstract :
In this work, a new approach on capacitors test and characterization is presented. The technique is based on a ammeter/voltmeter measurement setup using analog to digital converters (ADC) and an ellipse fitting signal processing algorithm. The method as shown here, is robust and allows accurate measurements in a wide range of frequency spectrum.
Keywords :
ammeters; analogue-digital conversion; electric impedance measurement; elliptic equations; signal processing; voltmeters; ADC; ammeter measurement; analog to digital converters; capacitors impedance measurement; ellipse fitting algorithm; ellipse fitting signal processing algorithm; subnyquist sampling; voltmeter measurement; Capacitors; Fitting; Frequency measurement; Impedance measurement; Instruments; Voltage measurement; ADC; capacitors; ellipse fitting;
Conference_Titel :
Renewable Energy Research and Applications (ICRERA), 2013 International Conference on
Conference_Location :
Madrid
DOI :
10.1109/ICRERA.2013.6749903
