DocumentCode :
3407502
Title :
Scalable visual sensitivity profile estimation
Author :
Zhai, Guangtao ; Chen, Qian ; Yang, Xiaokang ; Zhang, Wenjun
Author_Institution :
Inst. of Image Commun. & Inf. Process., Shanghai Jiao Tong Univ., Shanghai
fYear :
2008
fDate :
March 31 2008-April 4 2008
Firstpage :
873
Lastpage :
876
Abstract :
We propose a computational model for estimating scalable visual sensitivity profile (SVSP) of video, which is a hierarchy of saliency maps that simulates the bottom-up and top- down attention of the human visual system (HVS). The bottom- up process considers low level stimulus-driven visual features such as intensity, color, orientation and motion. The top-down process simulates the high level task-driven cognitive features such as finding human faces and captions in the video. The nonlinear addition model has been used for integrating low level visual features. A full center-surrounded receptive field profile is introduced to provide spatial scalability of the model. Due to the hierarchical nature, the proposed SVSP can be directly used to augment the visual quality of codings with spatial scalability. To justify the effectiveness of the proposed SVSP, extended experiments of its application in visual quality assessment are conducted.
Keywords :
video coding; visual perception; bottom-up attention; center-surrounded receptive field profile; computational model; human visual system; low level visual features; nonlinear addition model; scalable visual sensitivity profile estimation; spatial scalability; stimulus-driven visual features; task-driven cognitive features; top-down attention; video coding; visual quality assessment; Biological system modeling; Computational modeling; Face; Humans; Quality assessment; Scalability; Spatial resolution; Static VAr compensators; Video coding; Visual system; Human visual system; perceptual quality assessment; scalable video coding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE International Conference on
Conference_Location :
Las Vegas, NV
ISSN :
1520-6149
Print_ISBN :
978-1-4244-1483-3
Electronic_ISBN :
1520-6149
Type :
conf
DOI :
10.1109/ICASSP.2008.4517749
Filename :
4517749
Link To Document :
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