Title :
Gm/ID based noise analysis for CMOS analog circuits
Author_Institution :
Dept. of Eng. Sci., Sonoma State Univ., Rohnert Park, CA, USA
Abstract :
This paper proposes a technique to obtain thermal noise coefficient (γ) and corner frequency (fco) from simulation. Once determined, γ and fco can be integrated into the gm/ID design flow to simplify CMOS analog circuit design. A folded cascode operational transconductance amplifier (OTA) is designed to provide a point of comparison. A 10% error in input noise and a 25% error in output noise show that γ and fco can indeed be integrated into the gm/ID design flow.
Keywords :
CMOS analogue integrated circuits; integrated circuit noise; CMOS analog circuits; corner frequency; input noise error; noise analysis; output noise; output noise error; Analog circuits;
Conference_Titel :
Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-61284-856-3
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2011.6026580
