DocumentCode
3407686
Title
Fast and robust object segmentation with the Integral Linear Classifier
Author
Aldavert, David ; Ramisa, Arnau ; De Mantaras, Ramon Lopez ; Toledo, Ricardo
Author_Institution
Dept. Comput. Sci., Univ. Autonoma de Barcelona, Barcelona, Spain
fYear
2010
fDate
13-18 June 2010
Firstpage
1046
Lastpage
1053
Abstract
We propose an efficient method, built on the popular Bag of Features approach, that obtains robust multiclass pixel-level object segmentation of an image in less than 500ms, with results comparable or better than most state of the art methods. We introduce the Integral Linear Classifier (ILC), that can readily obtain the classification score for any image sub-window with only 6 additions and 1 product by fusing the accumulation and classification steps in a single operation. In order to design a method as efficient as possible, our building blocks are carefully selected from the quickest in the state of the art. More precisely, we evaluate the performance of three popular local descriptors, that can be very efficiently computed using integral images, and two fast quantization methods: the Hierarchical K-Means, and the Extremely Randomized Forest. Finally, we explore the utility of adding spatial bins to the Bag of Features histograms and that of cascade classifiers to improve the obtained segmentation. Our method is compared to the state of the art in the difficult Graz-02 and PASCAL 2007 Segmentation Challenge datasets.
Keywords
image classification; image segmentation; statistical analysis; accumulation step; bag-of-features approach; cascade classifiers; classification step; extremely randomized forest method; hierarchical k-means method; histograms; image sub-window; integral linear classifier; multiclass pixel-level object segmentation; Artificial intelligence; Computer science; Computer vision; Feature extraction; Histograms; Image segmentation; Object segmentation; Pixel; Quantization; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location
San Francisco, CA
ISSN
1063-6919
Print_ISBN
978-1-4244-6984-0
Type
conf
DOI
10.1109/CVPR.2010.5540098
Filename
5540098
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