• DocumentCode
    3407728
  • Title

    Efficient modeling of switch-level networks containing undetermined logic node states

  • Author

    Dahlgren, P. ; Liden, P.

  • Author_Institution
    Dept. of Comput. Eng., Chalmers Univ. of Technol., Gothenburg, Sweden
  • fYear
    1993
  • fDate
    7-11 Nov. 1993
  • Firstpage
    746
  • Lastpage
    752
  • Abstract
    The presence of realistic faults in CMOS networks, such as shorts and opens, frequently gives rise to intermediate voltage values. At the switch level, these values result in undetermined logic states which are likely to propagate to the outputs, causing an overly optimistic coverage estimation of test efficiency. A new method is presented that is efficient and well-suited for modeling switch-level networks when undetermined states are common. The concept of state dominance, introduced in this paper, is an improvement upon the well-known principle of dominance. The state dominance defines a dynamic direction of signal flow between neighboring nodes of undetermined logic state. A signal transformation scheme is proposed which solves bidirectional conflicts that may occur between adjacent nodes of undermined logic state without any network recomputation. The new concept is easily applicable to switch-level algorithms in which there is a distributed approach.
  • Keywords
    switched networks; CMOS networks; bidirectional conflicts; circuit modelling; distributed approach; dynamic signal flow direction; intermediate voltage values; neighboring nodes; open faults; overly optimistic coverage estimation; short circuits; signal transformation scheme; state dominance; switch-level networks; test efficiency; undetermined logic node states; CMOS logic circuits; Circuit faults; Circuit simulation; Feedback circuits; Logic testing; Predictive models; Semiconductor device modeling; Steady-state; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1993. ICCAD-93. Digest of Technical Papers., 1993 IEEE/ACM International Conference on
  • Conference_Location
    Santa Clara, CA, USA
  • Print_ISBN
    0-8186-4490-7
  • Type

    conf

  • DOI
    10.1109/ICCAD.1993.580172
  • Filename
    580172