DocumentCode :
3407770
Title :
Efficient rotation invariant object detection using boosted Random Ferns
Author :
Villamizar, Michael ; Moreno-Noguer, Francesc ; Andrade-Cetto, Juan ; Sanfeliu, Alberto
Author_Institution :
Inst. de Robot. i Inf. Ind., CSIC-UPC, Barcelona, Spain
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
1038
Lastpage :
1045
Abstract :
We present a new approach for building an efficient and robust classifier for the two class problem, that localizes objects that may appear in the image under different orientations. In contrast to other works that address this problem using multiple classifiers, each one specialized for a specific orientation, we propose a simple two-step approach with an estimation stage and a classification stage. The estimator yields an initial set of potential object poses that are then validated by the classifier. This methodology allows reducing the time complexity of the algorithm while classification results remain high. The classifier we use in both stages is based on a boosted combination of Random Ferns over local histograms of oriented gradients (HOGs), which we compute during a preprocessing step. Both the use of supervised learning and working on the gradient space makes our approach robust while being efficient at run-time. We show these properties by thorough testing on standard databases and on a new database made of motorbikes under planar rotations, and with challenging conditions such as cluttered backgrounds, changing illumination conditions and partial occlusions.
Keywords :
computational complexity; learning (artificial intelligence); object detection; pattern classification; boosted random ferns; classification stage; cluttered backgrounds; estimation stage; illumination conditions; oriented gradient histogram; partial occlusions; robust classifier; rotation invariant object detection; standard databases; supervised learning; time complexity; Classification algorithms; Databases; Histograms; Motorcycles; Object detection; Robustness; Runtime; Supervised learning; Testing; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location :
San Francisco, CA
ISSN :
1063-6919
Print_ISBN :
978-1-4244-6984-0
Type :
conf
DOI :
10.1109/CVPR.2010.5540104
Filename :
5540104
Link To Document :
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