DocumentCode :
3407788
Title :
A fast algorithm for VLSI net extraction
Author :
Lopez, M.A. ; Janardan, R. ; Sahni, S.
Author_Institution :
Dept. of Math. & Comput. Sci., Denver Univ., CO, USA
fYear :
1993
fDate :
7-11 Nov. 1993
Firstpage :
770
Lastpage :
774
Abstract :
Net extraction is crucial in VLSI design verification. Current algorithms for net extraction do not exploit the fact that the number, c, of different orientations of the line segments or polygon edges in a practical VLSI mask design is small relative to the number, n, of segments or edges. Instead, they rely on computing all intersections in the input and hence take time that is at least proportional to the number of intersections. In this paper we develop a simple and practical algorithm for net extraction that runs in O(cn log n) time and O(n) space, which is optimal for fixed c. Experiments indicate that the algorithm will generally outperform existing algorithms on practical VLSI designs. We expect that the techniques presented will be useful in other VLSI CAD problems that operate with restricted orientation geometries.
Keywords :
VLSI; VLSI CAD problems; VLSI design verification; VLSI mask design; VLSI net extraction; intersections; line segment orientations; polygon edge orientations; restricted orientation geometries; space complexity; time complexity; Algorithm design and analysis; Computer science; Data mining; Design automation; Error correction; Geometry; Mathematics; Object detection; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1993. ICCAD-93. Digest of Technical Papers., 1993 IEEE/ACM International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-4490-7
Type :
conf
DOI :
10.1109/ICCAD.1993.580176
Filename :
580176
Link To Document :
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