Title :
Modeling and Predicting Software Failure Costs
Author :
Grottke, Michael ; Graf, Christian
Author_Institution :
Dept. of Stat. & Econ., Univ. of Erlangen-Nurnberg, Nuremberg, Germany
Abstract :
For software, the costs of failures are not clearly understood. Often, these costs disappear in the costs of testing, the general developments costs, or the operating expenses. In a general manufacturing context, the British standard BS-6143-2:1990 classifies quality-related costs into prevention costs, appraisal costs, and failure costs. It furthermore recommends to identify the activities carried out within each of these categories, and to measure the costs connected with the activities. The standard thus presents a framework for recording and structuring costs once they have occurred. In this paper, we propose an approach for structuring the information on internal and external software failure costs such that their development over time can be represented by stochastic models. Based on these models, future failure costs can be predicted. In two case studies we show how the approach was applied in an industrial software development project.
Keywords :
Markov processes; program testing; project management; software cost estimation; software development management; software fault tolerance; software quality; BS-6143-2:1990 British standard; Markov reward model; appraisal cost; continuous-time Markov chain; development cost; industrial software development project management; manufacturing context; operating expense; prevention cost; quality-related cost classification; software failure cost prediction model; stochastic model; testing cost; Appraisal; Computer applications; Costs; Economic forecasting; Fault detection; Predictive models; Software maintenance; Software quality; Software testing; System testing; Markov reward model; activity-based costing; continuous-time Markov chain; cost prediction; software failure costs;
Conference_Titel :
Computer Software and Applications Conference, 2009. COMPSAC '09. 33rd Annual IEEE International
Conference_Location :
Seattle, WA
Print_ISBN :
978-0-7695-3726-9
DOI :
10.1109/COMPSAC.2009.195