• DocumentCode
    3408050
  • Title

    A simplified and approximate power MOSFET intrinsic capacitance simulation: Theoretical studies, measures and comparisons

  • Author

    Consentino, Giuseppe ; Ardita, Giovanni

  • Author_Institution
    Senior Applic. Lab. Eng for Modeling, STMicroelectron., Catania
  • fYear
    2008
  • fDate
    June 30 2008-July 2 2008
  • Firstpage
    38
  • Lastpage
    43
  • Abstract
    This paper implements a theoretical study on power MOSFETs internal capacitances. To simulate these capacitances the paper takes into consideration the internal structures of the power MOSFETs, materials and process characteristics. Finally, real measures are implemented on a power MOSFET device by ST and are compared to the simulated data to validate the model.
  • Keywords
    capacitance; power MOSFET; power MOSFET device; power MOSFET internal capacitances; power MOSFET internal structures; power MOSFET intrinsic capacitance simulation; Capacitance measurement; Dielectrics; MOS capacitors; MOSFET circuits; Power MOSFET; Power measurement; Silicon; Strips; Topology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. ISIE 2008. IEEE International Symposium on
  • Conference_Location
    Cambridge
  • Print_ISBN
    978-1-4244-1665-3
  • Electronic_ISBN
    978-1-4244-1666-0
  • Type

    conf

  • DOI
    10.1109/ISIE.2008.4676904
  • Filename
    4676904