• DocumentCode
    3408163
  • Title

    A low-power high-linearity symmetrical readout circuit for capacitive sensors

  • Author

    Kaimin Zhou ; Ziqiang Wang ; Fule Li ; Chun Zhang ; Zhihua Wang

  • Author_Institution
    Inst. of Microelectron., Tsinghua Univ., Beijing, China
  • fYear
    2011
  • fDate
    7-10 Aug. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a symmetrical readout circuit for capacitive sensors. Based on charge transfer principle, it is insensitive to stray capacitors. Introducing a reference branch, this symmetrical readout circuit can enlarge its linear range, reduce amplifier offsets and reject common-mode noise and even-order distortions. Chopper stabilization technique is used to reduce the negative effects of the amplifier offset and flicker (1/f) noise. A Verilog-A based varactor is used to model the real variable sensing capacitor. Simulation results are given for sensing capacitor changing frequency at 1 KHz. Metal-Insulator-Metal (MIM) capacitor array is designed on chip for measurement. Measurement results show that this circuit can achieve sensitivity of 370 mV/pF, linearity error below 1 % and power consumption as low as 2.5 mW. This symmetrical readout circuit can respond to FPGA controlled sensing capacitor array changed every 1 ms.
  • Keywords
    1/f noise; MIM devices; capacitive sensors; choppers (circuits); field programmable gate arrays; flicker noise; hardware description languages; low-power electronics; operational amplifiers; readout electronics; sensor arrays; varactors; 1/f noise; FPGA controlled sensing capacitor array; MIM capacitor array; Verilog-A based varactor; amplifier offset reduction; charge transfer principle; chopper stabilization technique; common-mode noise rejection; even-order distortion; flicker noise; frequency 1 kHz; linearity error; low-power high-linearity symmetrical readout circuit; metal-insulator-metal capacitor array; power consumption; stray capacitor; time 1 ms; Calibration; Capacitance; Micromechanical devices; Semiconductor device measurement; Sensitivity; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
  • Conference_Location
    Seoul
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-61284-856-3
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2011.6026615
  • Filename
    6026615