DocumentCode
3408733
Title
Agilent Technologies Technical White Paper; Agilent Application Mix: Realistic Performance and Stress Resilience Testing in Modern Business, Triple-Play and Multi-Service Converged Networks
fYear
2006
fDate
23-25 Oct. 2006
Firstpage
1
Lastpage
17
Abstract
In this paper Agilent Application Mix a realistic performance and stress resilience testing in modern business, triple play and multi-service converged networks is described. Peer-to-peer traffic now dominates public networks, real time applications are growing, and new application-layer attacks are emerging. To mitigate these trends and provide platforms for reliable real-time service delivery, network equipment is evolving to manage security, bandwidth and application quality. These trends and devices create new test challenges for service providers during network design, capacity planning and device evaluation; and vendor challenges during equipment design, system testing, and proof-of-concept demonstrations. Agilent´s Application Mix test methodology addresses these new challenges. Based on customer experience and real-world statistical data, Agilent has designed and developed test methodologies that stress application-aware devices and systems with emulated Internet traffic, to characterize real-world application performance, user capacity limits and device scalability
Keywords
Internet; peer-to-peer computing; telecommunication network planning; telecommunication security; telecommunication traffic; Agilent Application Mix; Internet traffic; capacity planning; multiservice converged networks; network equipment design; peer-to-peer traffic; public network; real-time service delivery; security management; stress application-aware devices; stress resilience testing; Bandwidth; Capacity planning; Internet; Paper technology; Peer to peer computing; Quality management; Resilience; Stress; System testing; Telecommunication traffic;
fLanguage
English
Publisher
ieee
Conference_Titel
Military Communications Conference, 2006. MILCOM 2006. IEEE
Conference_Location
Washington, DC
Print_ISBN
1-4244-0617-X
Electronic_ISBN
1-4244-0618-8
Type
conf
DOI
10.1109/MILCOM.2006.302541
Filename
4086705
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