• DocumentCode
    3408747
  • Title

    Introducing the ULE2 implanter

  • Author

    Sundstrom, H. ; Benveniste, V. ; Graf, M. ; Krull, W. ; Sinclair, F. ; Kinney, T.

  • Author_Institution
    Eaton Corp., Beverly, MA, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    184
  • Abstract
    The continued scaling of semiconductor devices toward smaller geometries imposes a requirement on ion implantation equipment to maintain production worthy beam currents at energies well below 10 keV. The Eaton ULE2 Ultra Low Energy implanter has been specifically developed to satisfy production requirements for 0.25 μm, 0.18 μm and 0.13 μm technology nodes. The use of an RF `bucket´ ion source, analyzer magnet with distributed focusing and Plasma Cell charge control technology as well as an open beamline design enable the ULE2 to deliver production worthy beam currents down to 1 keV with advanced development capability down to 200 eV in drift mode. A new end station incorporating a 6 cassette microstocker has allowed the ULE2 to maintain a small footprint. The design of the beamline, wafer handling system and implanter performance is described, as well as the implanter layout and construction
  • Keywords
    beam handling equipment; ion implantation; particle beam diagnostics; semiconductor device manufacture; semiconductor doping; 0.13 mum; 0.18 mum; 0.25 mum; 10 keV; 200 eV; 6 cassette microstocker; Eaton ULE2 Ultra Low Energy implanter; Plasma Cell charge control technology; ULE2 implanter; advanced development capability; analyzer magnet; bucket ion source; distributed focusing; ion implantation equipment; open beamline design; production worthy beam currents; scaling; semiconductor devices; smaller geometries; Geometry; Ion implantation; Ion sources; Magnetic analysis; Plasma immersion ion implantation; Plasma sources; Production; Radio frequency; Semiconductor devices; Structural beams;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology Proceedings, 1998 International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    0-7803-4538-X
  • Type

    conf

  • DOI
    10.1109/IIT.1999.812083
  • Filename
    812083