DocumentCode :
3408797
Title :
Introducing the NV-GSD-HE3, a new high energy implanter
Author :
Sugitani, Michiro ; Tsukihara, Mitsukuni ; Takei, Shusaku ; McIntryre, E. ; DeLuca, Don ; Parrill, Tom
Author_Institution :
Sumitomo Eaton Nova Corp., Ehime, Japan
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
192
Abstract :
A new high energy implanter, the NV-GSD-HE3, improving upon the design concepts of the industry-leading GSD/HE series, has been developed in order to meet new and future device process requirements. Besides processing 300-mm wafers, the HE3 produces higher ion energies than the GSD/HE in a package that incorporates higher efficiency linear accelerator technology. The system layout has also been optimized so that footprint is reduced compared to the GSD/VHE while maintaining the same twin well and triple well process capability. A new endstation capable of batch processing 300-mm wafers, at a mechanical throughput equal to or exceeding that for 200-mm wafers in the GSD/HE system, has been developed. An evolutionary beam line has been developed, including a new mass-analysis magnet, final energy magnet and resonators with increased voltage output and higher efficiency. The HE3 also incorporates the extended life source technology, designed to obtain high beam current and long source life for multiply charged ions
Keywords :
VLSI; batch processing (industrial); integrated circuit manufacture; ion implantation; semiconductor doping; 300 mm; 300-mm wafers; NV-GSD-HE3; VLSI; batch processing; beam line; design concepts; device process requirements; endstation; extended life source technology; final energy magnet; high beam current; high energy implanter; linear accelerator technology; long source life; mass-analysis magnet; mechanical throughput; multiply charged ions; resonators; system layout; triple well process capability; twin well process capability; voltage output; Boron; Costs; Energy consumption; Helium; Manufacturing; Packaging; Production; Throughput; Toy industry; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ion Implantation Technology Proceedings, 1998 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
0-7803-4538-X
Type :
conf
DOI :
10.1109/IIT.1999.812085
Filename :
812085
Link To Document :
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