• DocumentCode
    3408808
  • Title

    Author index

  • fYear
    2001
  • fDate
    7-7 Aug. 2001
  • Firstpage
    105
  • Lastpage
    105
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design and Testing, IEEE International Workshop on, 2001.
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    0-7695-1242-9
  • Type

    conf

  • DOI
    10.1109/MTDT.2001.945237
  • Filename
    945237