DocumentCode :
3408888
Title :
Enhanced low energy drift-mode beam currents in a high current ion implanter
Author :
Angel, Gordon ; Bell, Edward ; Brown, Douglas ; Buff, James ; Collins, Mark ; Cummings, James ; Radovanov, Svetlana ; White, Nicholas R.
Author_Institution :
Varian Ion Implant Syst., Gloucester, MA, USA
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
219
Abstract :
The VIISta 80 high current ion implanter uses one or two stages of deceleration to produce the requisite high beam currents at low energies. For implantation processes that have a zero tolerance for energy contamination the single stage of deceleration located before the final bending magnet provides an enhanced drift mode of operation in which the end station sees ions issuing from a virtual source located at the mass slit. The development of the deceleration system and some preliminary results are discussed
Keywords :
beam handling techniques; ion implantation; particle beam diagnostics; semiconductor device manufacture; semiconductor doping; VIISta 80 high current ion implanter; deceleration; energy contamination; enhanced low energy drift-mode beam currents; high beam currents; high current ion implanter; mass slit; virtual source; zero tolerance; Boron; Contamination; Electrostatics; Energy resolution; Implants; Magnetic analysis; Production; Semiconductor device manufacture; Space charge; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ion Implantation Technology Proceedings, 1998 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
0-7803-4538-X
Type :
conf
DOI :
10.1109/IIT.1999.812091
Filename :
812091
Link To Document :
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