• DocumentCode
    3409448
  • Title

    FPGA-based hardware in the loop validation for fault tolerant three-phase active filter

  • Author

    Karimi, Shahram ; Poure, Phillipe ; Saadate, Shahrokh

  • Author_Institution
    Fac. des Sci. et Tech., Nancy Univ., Nancy
  • fYear
    2008
  • fDate
    June 30 2008-July 2 2008
  • Firstpage
    2189
  • Lastpage
    2194
  • Abstract
    This paper proposes a new robust fast power switch fault detection and compensation for a three phase shunt active filter without redundant leg. The approach introduced in this paper minimizes the time interval between the fault occurrences and its diagnosis. This paper demonstrates the possibility to detect a faulty switch of the active filter in less than 10 mus by using simultaneously a ldquotime criterionrdquo and a ldquovoltage criterionrdquo without false fault detection due to power semiconductors switching. In order to attain this short detection time a FPGA (field programmable gate array) is used. After fault detection, the classical three-leg shunt active filter is reconfigured in a two-leg topology. In this case the faulty phase is connected to the middle point of the DC bus. The studied fault detection method is implemented using a FPGA and experimentally validated. The experimental results based on ldquoFPGA in the looprdquo hardware prototyping show good agreement with theoretically analyses.
  • Keywords
    active filters; fault tolerance; field programmable gate arrays; FPGA-based hardware; fault occurrences; fault tolerant three-phase active filter; field programmable gate array; loop validation; power semiconductors switching; robust fast power switch fault detection; two-leg topology; voltage criterion; Active filters; Fault detection; Fault diagnosis; Fault tolerance; Field programmable gate arrays; Hardware; Leg; Power semiconductor switches; Robustness; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. ISIE 2008. IEEE International Symposium on
  • Conference_Location
    Cambridge
  • Print_ISBN
    978-1-4244-1665-3
  • Electronic_ISBN
    978-1-4244-1666-0
  • Type

    conf

  • DOI
    10.1109/ISIE.2008.4676980
  • Filename
    4676980