Title :
Image denoising based on a statistical model for wavelet coefficients
Author :
Koo, Hyung Il ; Cho, Nam Ik
Author_Institution :
Sch. of Electr. Eng., Seoul Nat. Univ., Seoul
fDate :
March 31 2008-April 4 2008
Abstract :
In this paper, we propose a new statistical model for the relationship of wavelet coefficients and its application to image denoising. The magnitude of a wavelet coefficient usually shows high correlations with the nearby ones. This property has been exploited in many wavelet-based image processing techniques. However, conventional works consider only the local neighborhood of a coefficient when inferring its hidden state. Consequently, the image context is not faithfully reflected and thus there are sometimes visually annoying artifacts. We attempt to alleviate this problem by developing a new statistical model for the random field that is consisted of hidden variables of the overall band and thus includes global relationship of wavelet coefficients. In this model, the image context is encoded by the relations of hidden states, and the state plane is efficiently inferred by the sum-product algorithm. In the experiment, the proposed model is incorporated with the state-of-the-art denoising algorithm, namely BLS- GSM (Bayes least square - Gaussian scale mixture). The results show that the proposed algorithm suppresses many annoying artifacts that exist in the conventional denoising methods, and thus improves the subjective quality.
Keywords :
Bayes methods; Gaussian processes; image denoising; least squares approximations; statistical analysis; wavelet transforms; Bayes least square; Gaussian scale mixture; image denoising; statistical model; sum-product algorithm; wavelet coefficient; Clustering algorithms; Context modeling; Image coding; Image denoising; Image processing; Inference algorithms; Noise reduction; Sum product algorithm; Wavelet coefficients; Wavelet transforms; Bayesian Estimation; Conditional Random Fields; Image Denoising;
Conference_Titel :
Acoustics, Speech and Signal Processing, 2008. ICASSP 2008. IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-1483-3
Electronic_ISBN :
1520-6149
DOI :
10.1109/ICASSP.2008.4517848