DocumentCode :
3409642
Title :
A sparse multi-class Least-Squares Support Vector Machine
Author :
Xia, Xiao-Lei Celina ; Li, Kang
Author_Institution :
Sch. of Electron., Electr. Eng. & Comput. Sci., Queen´´s Univ. Belfast, Belfast
fYear :
2008
fDate :
June 30 2008-July 2 2008
Firstpage :
1230
Lastpage :
1235
Abstract :
The paper presents a new multi-class least-squares support vector machine (LS-SVM) whose solution is sparse in the weight coefficient of support vectors. The solution of a binary LS-SVM support vector machine (LS-SVM) is constructed from most of the training samples, which is referred to as the non-sparseness problem. Multi-class LS-SVMs, which are learnt on the basis of binary classifiers inevitably share the same problem of the slowdown of the resulting LS-SVM classification on test examples. This paper addresses this issue by presenting a variant of the binary LS-SVM, in which the spareness of the solution is greatly improved. A new sparse multi-class SVM is developed from the binary case. The training of the LS-SVM method is implemented using an adapted two-stage regression algorithm. Experiments on synthetic data show that the novel multi-class LS-SVM reduces the number of weights parameters with which the resultant optimal hyperplane is spanned, while maintaining competitive generalization capacity compared with conventional LS-SVM classifiers.
Keywords :
learning (artificial intelligence); least squares approximations; regression analysis; support vector machines; LS-SVM; generalization capacity; nonsparseness problem; sparse multiclass least-squares support vector machine; two-stage regression algorithm; weight coefficient; Algorithm design and analysis; Computer science; Equations; Iterative algorithms; Iterative methods; Quadratic programming; Support vector machine classification; Support vector machines; Telephony; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2008. ISIE 2008. IEEE International Symposium on
Conference_Location :
Cambridge
Print_ISBN :
978-1-4244-1665-3
Electronic_ISBN :
978-1-4244-1666-0
Type :
conf
DOI :
10.1109/ISIE.2008.4676989
Filename :
4676989
Link To Document :
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