• DocumentCode
    3409642
  • Title

    A sparse multi-class Least-Squares Support Vector Machine

  • Author

    Xia, Xiao-Lei Celina ; Li, Kang

  • Author_Institution
    Sch. of Electron., Electr. Eng. & Comput. Sci., Queen´´s Univ. Belfast, Belfast
  • fYear
    2008
  • fDate
    June 30 2008-July 2 2008
  • Firstpage
    1230
  • Lastpage
    1235
  • Abstract
    The paper presents a new multi-class least-squares support vector machine (LS-SVM) whose solution is sparse in the weight coefficient of support vectors. The solution of a binary LS-SVM support vector machine (LS-SVM) is constructed from most of the training samples, which is referred to as the non-sparseness problem. Multi-class LS-SVMs, which are learnt on the basis of binary classifiers inevitably share the same problem of the slowdown of the resulting LS-SVM classification on test examples. This paper addresses this issue by presenting a variant of the binary LS-SVM, in which the spareness of the solution is greatly improved. A new sparse multi-class SVM is developed from the binary case. The training of the LS-SVM method is implemented using an adapted two-stage regression algorithm. Experiments on synthetic data show that the novel multi-class LS-SVM reduces the number of weights parameters with which the resultant optimal hyperplane is spanned, while maintaining competitive generalization capacity compared with conventional LS-SVM classifiers.
  • Keywords
    learning (artificial intelligence); least squares approximations; regression analysis; support vector machines; LS-SVM; generalization capacity; nonsparseness problem; sparse multiclass least-squares support vector machine; two-stage regression algorithm; weight coefficient; Algorithm design and analysis; Computer science; Equations; Iterative algorithms; Iterative methods; Quadratic programming; Support vector machine classification; Support vector machines; Telephony; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. ISIE 2008. IEEE International Symposium on
  • Conference_Location
    Cambridge
  • Print_ISBN
    978-1-4244-1665-3
  • Electronic_ISBN
    978-1-4244-1666-0
  • Type

    conf

  • DOI
    10.1109/ISIE.2008.4676989
  • Filename
    4676989