• DocumentCode
    3410009
  • Title

    A new texture descriptor using multifractal analysis in multi-orientation wavelet pyramid

  • Author

    Xu, Yong ; Yang, Xiong ; Ling, Haibin ; Ji, Hui

  • Author_Institution
    Sch. of Comput. Sci. & Eng., South China Univ. of Tech., Guangzhou, China
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    161
  • Lastpage
    168
  • Abstract
    Based on multifractal analysis in wavelet pyramids of texture images, a new texture descriptor is proposed in this paper that implicitly combines information from both spatial and frequency domains. Beyond the traditional wavelet transform, a multi-oriented wavelet leader pyramid is used in our approach that robustly encodes the multi-scale information of texture edgels. Moreover, the resulting texture model shows empirically a strong power law relationship for nature textures, which can be characterized well by multifractal analysis. Combined with a statistics on affine invariant local patches, our proposed texture descriptor is robust to scale and rotation changes, more general geometrical transforms and illumination variations. In addition, the proposed texture descriptor is computationally efficient since it does not require many expensive processing steps, e.g., texton generation and cross-bin comparisons, which are often used by existing methods. As an application, the proposed descriptor is applied to texture classification and the experimental results on several public texture datasets verified the accuracy and efficiency of our descriptor.
  • Keywords
    fractals; image classification; image texture; visual databases; wavelet transforms; affine invariant local patches; frequency domains; geometrical transforms; illumination variations; multifractal analysis; multiorientation wavelet pyramid; multiscale information; nature textures; power law relationship; public texture datasets; rotation changes; spatial domains; texture classification; texture descriptor; texture edgels; texture images; wavelet transform; Fractals; Frequency domain analysis; Image analysis; Image texture analysis; Information analysis; Robustness; Statistics; Wavelet analysis; Wavelet domain; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-6984-0
  • Type

    conf

  • DOI
    10.1109/CVPR.2010.5540217
  • Filename
    5540217