DocumentCode
3410009
Title
A new texture descriptor using multifractal analysis in multi-orientation wavelet pyramid
Author
Xu, Yong ; Yang, Xiong ; Ling, Haibin ; Ji, Hui
Author_Institution
Sch. of Comput. Sci. & Eng., South China Univ. of Tech., Guangzhou, China
fYear
2010
fDate
13-18 June 2010
Firstpage
161
Lastpage
168
Abstract
Based on multifractal analysis in wavelet pyramids of texture images, a new texture descriptor is proposed in this paper that implicitly combines information from both spatial and frequency domains. Beyond the traditional wavelet transform, a multi-oriented wavelet leader pyramid is used in our approach that robustly encodes the multi-scale information of texture edgels. Moreover, the resulting texture model shows empirically a strong power law relationship for nature textures, which can be characterized well by multifractal analysis. Combined with a statistics on affine invariant local patches, our proposed texture descriptor is robust to scale and rotation changes, more general geometrical transforms and illumination variations. In addition, the proposed texture descriptor is computationally efficient since it does not require many expensive processing steps, e.g., texton generation and cross-bin comparisons, which are often used by existing methods. As an application, the proposed descriptor is applied to texture classification and the experimental results on several public texture datasets verified the accuracy and efficiency of our descriptor.
Keywords
fractals; image classification; image texture; visual databases; wavelet transforms; affine invariant local patches; frequency domains; geometrical transforms; illumination variations; multifractal analysis; multiorientation wavelet pyramid; multiscale information; nature textures; power law relationship; public texture datasets; rotation changes; spatial domains; texture classification; texture descriptor; texture edgels; texture images; wavelet transform; Fractals; Frequency domain analysis; Image analysis; Image texture analysis; Information analysis; Robustness; Statistics; Wavelet analysis; Wavelet domain; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location
San Francisco, CA
ISSN
1063-6919
Print_ISBN
978-1-4244-6984-0
Type
conf
DOI
10.1109/CVPR.2010.5540217
Filename
5540217
Link To Document