DocumentCode
3410024
Title
Applying the log-cumulants of texture parameter to fully polarimetric SAR classification using Support Vector Machines Classifier
Author
Liu, Meng ; Zhang, Hong ; Wang, Chao
Author_Institution
Grad. Univ. of Chinese Acad. of Sci., Beijing, China
Volume
1
fYear
2011
fDate
24-27 Oct. 2011
Firstpage
728
Lastpage
731
Abstract
In this paper, we proposed a fully polarimetric SAR classification method based on the log-cumulants of texture parameter of the fully polarimetric SAR data. Unlike other classification algorithms that classify pixels by their scattering characteristics, this method will use a combination of the texture parameter of fully polarimetric SAR data and the Support Vector Machines (SVM) Classifier based on the spherically invariant random vectors (SIRV) model. A full polarimetric image Oberpfaffenhofen region in Germany, acquired by E-SAR at L-band, is used for our experiment. It is shown that the proposed method is consistent with the actual scattering mechanisms, especially for urban areas, and can be used to effectively distinguish different types of terrains.
Keywords
higher order statistics; radar polarimetry; support vector machines; synthetic aperture radar; log-cumulants; polarimetric SAR classification; spherically invariant random vectors model; support vector machines classifier; texture parameter; Clutter; Covariance matrix; Scattering; Support vector machines; Urban areas; Vectors; Log-Cumulants; Polarimetric SAR Classification; Spherically Invariant Random Vectors Model; Support Vector Machines Classifier;
fLanguage
English
Publisher
ieee
Conference_Titel
Radar (Radar), 2011 IEEE CIE International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-8444-7
Type
conf
DOI
10.1109/CIE-Radar.2011.6159644
Filename
6159644
Link To Document