DocumentCode
3410145
Title
Use of statecharts-related description to achieve testable design of control subsystems
Author
Fummi, F. ; Sami, Me G. ; Tartarini, F.
Author_Institution
Dipt. di Elettronica, Politecnico di Milano, Italy
fYear
1997
fDate
13-15 Mar 1997
Firstpage
118
Lastpage
123
Abstract
Control-dominated architectures are efficiently described by means of graphical representations based on statecharts. Statecharts descriptions can be automatically translated into HDL representations (VHDL or Verilog) which are directly synthesized into gate-level netlists. This paper describes a set of rules which transform, if possible, a statecharts description into a simpler representation based on hierarchically interconnected FSMs (HFSM). The comparison of the HFSM description with the gate-level synthesized net-list allows to efficiently perform redundancies removal and test pattern generation. Thus, by applying the proposed testing strategy, fully testable implementations can be obtained even for such devices which cannot be satisfactorily analyzed at the gate level only
Keywords
VLSI; automatic testing; design for testability; finite state machines; graph theory; logic CAD; logic testing; redundancy; HDL representations; TPG; control subsystems; gate-level netlists; graphical representations; hierarchically interconnected FSMs; redundancies removal; statecharts-related description; test pattern generation; testable design; testing strategy; Automatic control; Automatic testing; Circuit faults; Circuit testing; Control systems; Hardware design languages; Pattern analysis; Redundancy; Sequential circuits; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI, 1997. Proceedings. Seventh Great Lakes Symposium on
Conference_Location
Urbana-Champaign, IL
ISSN
1066-1395
Print_ISBN
0-8186-7904-2
Type
conf
DOI
10.1109/GLSV.1997.580513
Filename
580513
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