DocumentCode
3410448
Title
Optimal positioning of geo-referenced short circuit sensors for faster fault finding using genetic algorithm
Author
De Santana, F. J R ; de Almeida, L.A.L. ; Costa, F.F.
Author_Institution
Electr. Utility of Bahia, COELBA, Salvador
fYear
2008
fDate
June 30 2008-July 2 2008
Firstpage
2236
Lastpage
2241
Abstract
The performance of electric energy distribution system is strongly affected by faults. System restoration is critical due to difficulties in searching process by the utilities maintenance crew. Usually fault searching methods employed by utilities may lead to different locations to the same fault, mainly if the feeder is dense connected. There have been many approaches in order to overcome this problem. One popular method applies short-circuits indicators to be allocated along the feeders. Nevertheless, their cost can be a limitation for the method. In this context, this work issues the problem of optimal short-circuit indicator allocation along electrical network. The allocation is optimally accomplished in order to minimize the fault searching area of the utility maintenance crew. As the the problem formulation leads to a multimodal discrete nonlinear optimization, a genetic algorithm has been the optimizer tool selected to accomplished it. The technique has been tested on a model of a feeder of an Brazilpsilas Utility. The results showed a significant improvement over ad-hoc methodologies usually adopted by utilities.
Keywords
electric sensing devices; genetic algorithms; power distribution faults; short-circuit currents; electric energy distribution system; electrical network; genetic algorithm; geo-referenced short circuit sensors; multimodal discrete nonlinear optimization; optimal positioning; searching process; system restoration; Circuit faults; Fault location; Frequency; Genetic algorithms; Impedance; Power system modeling; Power system reliability; Power system restoration; Relays; Substations;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2008. ISIE 2008. IEEE International Symposium on
Conference_Location
Cambridge
Print_ISBN
978-1-4244-1665-3
Electronic_ISBN
978-1-4244-1666-0
Type
conf
DOI
10.1109/ISIE.2008.4677030
Filename
4677030
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