DocumentCode :
3410738
Title :
Temperature calibration of CMOS magnetic vector probe for contactless angle measurement system
Author :
Schneider, M. ; Haberli, A. ; Metz, M. ; Malcovati, P. ; Baltes, H.
Author_Institution :
Phys. Electron. Lab., Eidgenossische Tech. Hochschule, Zurich, Switzerland
fYear :
1996
fDate :
8-11 Dec. 1996
Firstpage :
533
Lastpage :
536
Abstract :
This paper reports on the offset behavior of an integrated CMOS magnetotransistor vector probe. For the first time, measurement results on the temperature dependence of the offset and on its time stability are presented. They encourage the realization of a temperature calibrated angle measurement system. This system consists of a two dimensional magnetic sensor integrated with circuitry on a single chip in combination with a small permanent magnet. It exhibits 1/spl deg/ resolution and 3/spl deg/ accuracy.
Keywords :
CMOS integrated circuits; angular measurement; calibration; circuit stability; magnetic sensors; mixed analogue-digital integrated circuits; probes; signal processing equipment; CMOS magnetic vector probe; contactless angle measurement system; galvanomagnetic effects; integrated CMOS magnetotransistor vector probe; offset behavior; single chip integration; small permanent magnet; temperature calibration; temperature dependence; time stability; two dimensional magnetic sensor; Calibration; Circuit stability; Goniometers; Integrated circuit measurements; Probes; Semiconductor device measurement; Temperature dependence; Temperature measurement; Temperature sensors; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1996. IEDM '96., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-3393-4
Type :
conf
DOI :
10.1109/IEDM.1996.554037
Filename :
554037
Link To Document :
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