Title :
Testing microwave devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients
Author :
Madonna, Gian Luigi ; Pirola, Marco ; Pisani, U.
Author_Institution :
Dipt. di Elettronica, Torino Univ.
Abstract :
This paper describes a new approach for fast and accurate determination of the source reflection coefficient in microwave source-pull measurements. To the authors´ knowledge, this is the only technique that allows the simultaneous measurement of the source and the DUT gammas. A traditional vector network analyzer is used as a three-channel receiver. The calibration procedure is based on a new reflectometer model that extends the traditional error box concept. Experimental results are presented and compared to data obtained with traditional techniques
Keywords :
calibration; computerised instrumentation; microwave reflectometry; network analysers; DUT gammas; calibration; device reflection coefficients; microwave devices; microwave source-pull measurement; online measurement; reflectometer model; simultaneous measurement; source; three-channel receiver; vector network analyzer; Calibration; Impedance measurement; Low-noise amplifiers; Microwave devices; Microwave generation; Microwave measurements; Microwave theory and techniques; Reflection; Testing; Tuners;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
Print_ISBN :
0-7803-5276-9
DOI :
10.1109/IMTC.1999.776733