• DocumentCode
    341107
  • Title

    Compatibility in industrial measurements

  • Author

    Zingales, Giuseppe

  • Author_Institution
    Dept. of Electr. Eng., Padova Univ., Italy
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    377
  • Abstract
    In assessing the quality of an industrial product it is often necessary to state the compatibility between few (for instance two) independent measurement results. The case of two instruments with independent metrological characteristics but having received appropriate calibration and uncertainty statements is here considered. They will always produce compatible results when applied to the same measurand of negligible intrinsic uncertainty. Different hypotheses may however be assumed in determining this measurand by means of a central value and a width for its uncertainty interval. Furthermore, in the case of industrial measurements, measurands have a non negligible intrinsic uncertainty, that is usually increased by the object and test conditioning. It may therefore be necessary to consider the full range of the probability distribution for the difference between the outputs of the two instruments. The statement of compatibility conditions becomes therefore more difficult. It is a task of the standardising organisations to prepare internationally valid procedures for attaining univocal conclusions
  • Keywords
    calibration; measurement errors; measurement standards; probability; quality management; calibration; compatibility; industrial measurements; industrial product; metrological characteristics; negligible intrinsic uncertainty; probability distribution; quality; standardising organisations; test conditioning; traceability; uncertainty; uncertainty statements; Calibration; Density measurement; Electric variables measurement; Electrical products industry; Globalization; Instruments; Measurement standards; Measurement uncertainty; Probability distribution; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
  • Conference_Location
    Venice
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5276-9
  • Type

    conf

  • DOI
    10.1109/IMTC.1999.776779
  • Filename
    776779