Title :
Offset reduction in multicollector magnetotransistors
Author :
Metz, M. ; Schneider, M. ; Haberli, A. ; Baltes, H.
Author_Institution :
Phys. Electron. Lab., Eidgenossische Tech. Hochschule, Zurich, Switzerland
Abstract :
Integrated CMOS magnetotransistor vector probes are well suited for contactless angle measurement systems. The signal offset is the limiting factor for their accuracy. Using novel multicollector magnetotransistors we achieve dynamic offset reduction by a factor of up to four largely independent of temperature by separating offset and magnetic response according to their spatial symmetries.
Keywords :
CMOS integrated circuits; MOSFET; angular measurement; integrated circuit measurement; magnetic sensors; mixed analogue-digital integrated circuits; signal processing equipment; contactless angle measurement systems; dynamic offset reduction; integrated CMOS magnetotransistor vector probes; magnetic response; multicollector magnetotransistors; offset reduction; signal offset; spatial symmetries; CMOS process; Calibration; Goniometers; Laboratories; Magnetic devices; Magnetic sensors; Magnetic separation; Neodymium; Probes; Temperature sensors;
Conference_Titel :
Electron Devices Meeting, 1996. IEDM '96., International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-3393-4
DOI :
10.1109/IEDM.1996.554040
